■Semiconductor Manufacturing Fab Data AI utilization Idea Contest
1st Place
Context Base Condition Monitoring System with Qualitative Features (Maintenance logs, Engineering knowledge & Lot information)
UT-BS3
Koichi Sumiya, RAN ZHANG, and Sera Tsunoda
University of Tsukuba
2nd Place
The early detection and prediction of road anomalies by IoT deceives attached to cars
UT-BS-T2
Hirotaka Ouchi, Sato Mario Tsukassa, WANG TONGHE
University of Tsukuba
3rd Place
Matching System Approach to Human Resources Employment Issues
UT-BS-T6
Lie He, Junzhen Li, Kota Tahara, and Takumi Wada University of Tsukuba
■AI Algorithm Contest Smart Metrology Challenge Using Semiconductor Actual Tool Data
1st Place
Mrigenda Agrawal
University Of Petroleum And Energy Studies (India)
2nd Place
Shimane_coppepan
Shota Shikama
Kyushu University Graduate School of Information Science (Japan)
3rd Place
Rebecca Busch
University of Siegen (Germany)
■Hitachi High-Tech Award
Mrigenda Agrawal
University Of Petroleum And Energy Studies (India)
Sato Mario Tsukasa
University of Tsukuba
Zhang Ran
University of Tsukuba
Sera Tsunoda
University of Tsukuba
ISSM Secretariat
C/O Semiconductor Poral, Inc.
6F Urban Toranomon Bldg., 1-16-4 Toranomon, Minato-ku, Tokyo 105-0001 Japan
issm_2022@semiconportal.com
https://issm.semiconportal.net/
Copyright@ISSM2022
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